PROBE SYSTEM FOR LIFE ®
Our Solution
Manual, semiautomatic and fully automatic systems with probing capabilities ranging from individual die to 450 mm wafers/substrates.
The Probe System for Life ® (PS4L) family of wafer probing systems is designed based on SemiProbe’s patented adaptive architecture. Unlike traditional probe systems, all foundation modules – bases, stages, chucks, microscope mounts, microscope movements, optics, manipulators and more - are interchangeable, making the PS4L the consummate solution for many different applications and budgets. This unique modular design enables customers to acquire test capabilities that precisely match their requirements. More important, as the environment or test conditions change, the PS4L can easily be field-upgraded to meet these new demands. With this design philosophy, PS4L customers realize substantial time and cost savings over traditional probe systems because they do not need to invest in a new platform when wafer size, levels of automation, or test requirements change.


6-12″半自动探针测试系统
晶圆尺寸:≤ 300 mm
主要应用:设备特性,MEMS,光电,光伏,HF /微波,失效分析,研究,材料科学等领域

失效分析探针台
晶圆尺寸:≤ 450 mm
主要应用:失效分析

ESD 测试探针台
晶圆尺寸: ≤300mm
主要应用: TLP, VF-TLP, HBM ESD 及MM ESD晶园测试,包括管脚及平面电流、电压测试