ECP Series Probe

ECP series probe

The ECP probes are great for testing devices that have large pads or bumps, such as PCB’s or BGA’s, and for devices that have non-planar surfaces.

Features

Independent moving BeCu tips:

The Model ECP18 and Model ECP40 Picoprobes have independently moving BeCu tips--the ground tips and the signal tip move up and down on the Z-axis independent of each other.

Large Contact Area:

The tips are flat and square and look like 50um tall posts hanging off the 0.047" coax.

For any pitch up to 250um, the contact area of each tip is approximately 40x40um;

75x75um for any pitch from 275um to 600um; and 150x150um for any pitch from 625um to 3000um.

As the tips wear from use, the size of the contact area (ie: 40x40um) remains the same.

Specification

mechanical

High Current Version

Optional**

	ECP18	ECP40
CONNECTOR TYPE	female SMA connector	female 2.92mm connector
FOOT PRINT	GSG,SG,GS
PICTH	100-3000um (25um increment)
INDEPENDENT MOVING TIP	BECU TIP
BODY STYLE	DP, EDP,S,DS
Contact Area:	pitch up to 250um : 40x40um
	pitch 275um – 600um: 75x75um
	pitch 625um-3000um: 150x150um

	ECP18	ECP40
2GHz	60 Watts
5GHz	36 Watts
10GHz	27 Watts
18Ghz	19 Watts
40Ghz	DNA	13 Watts

*ECP probes can be used for the above power at 100% Duty Cycle.

**High Current version of the probe is also offered. The chart below characterizes the probe performance at various frequency.